An Integrated Heated Testbench for Characterizing High Temperature ICs

authored by

Fritz Webering, Guillermo Payá Vayá, Evan Aditya, Jan Christoph Dürre, Holger Christoph Blume

Organisation(s)

Architectures and Systems Section

Type

Conference contribution

No. of pages

18

Publication date

2017

Publication status

Published

Electronic version(s)

https://www.researchgate.net/publication/316878613_An_Integrated_Heated_Testbench_for_Characterizing_High_Temperature_ICs (Access: Open)
https://doi.org/10.15488/13694 (Access: Open)