Preface

authored by: Małgorzata Chrzanowska-Jeske, Kirsten Weide-Zaage
Organisation(s): Institute of Microelectronic Systems
Institute for Risk and Reliability
External Organisation(s): Portland State University
Institute of Electrical and Electronics Engineers (IEEE)
Type: Foreword/postscript
Pages: xiii-xvii
Publication date: 25.11.2016
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Engineering(all)
Electronic version(s): https://doi.org/10.1201/9781315368948 (Access: Closed)