How SI/EMC and reliability issues could interact together in embedded electronic systems?
- authored by
- Kirsten Weide-Zaage, Aymen Moujbani, Genevieve Duchamp, Tristan Dubois, Frederic Verdier, Helene Fremont
- Abstract
The design process of integrated circuits is based on guidelines by the technological feasibility to achieve minimum structural size. Furthermore quality criteria like reliability and lifetime of the circuit influence the layout. The density of transistors increases and the supplied voltages as well as the noise margins also increase. In this frame the signal integrity as well as the electromagnetic behavior of IC interconnects, the traces in the printed circuit board, the connections of packages, have to be taken into account. Especially in 3-D integration and under harsh environment conditions the electromagnetic field has to be investigated.
- Organisation(s)
-
Institute of Microelectronic Systems
- External Organisation(s)
-
Universite de Bordeaux
- Type
- Conference contribution
- Pages
- 1323-1328
- No. of pages
- 6
- Publication date
- 10.09.2015
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Condensed Matter Physics, Electrical and Electronic Engineering
- Electronic version(s)
-
https://doi.org/10.1109/isemc.2015.7256363 (Access:
Closed)
