Verifikation der layout getreuen FE-simulation eines MO-166 gehäuses mittels elektrischer messung und IR-untersuchung

authored by: K. Weide-Zaage, C. Keck, J. Willemen
Organisation(s): Laboratorium f. Informationstechnologie
External Organisation(s): Robert Bosch GmbH
Type: Conference article
Journal: ITG-Fachbericht
Pages: 219
No. of pages: 1
ISSN: 0932-6022
Publication date: 2001
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Software, Hardware and Architecture