A design for robust wide metal tracks

authored by

M. Ackermann, V. Hein, C. Kovács, K. Weide-Zaage

Abstract

By this article an introduction of a highly robust metal track layout especially suitable for high current and temperature applications will be introduced. Starting with the reliability limitations normally observed for wide metal tracks, conclusions regarding the requirements for robust layout techniques will be drawn. An optimized structure will be presented as well as the very promising results of first reliability investigations. It will be demonstrated that and how the optimized design is reducing the occurrence of degradation and instability effects.

Organisation(s)

Laboratorium f. Informationstechnologie

External Organisation(s)

X-FAB Silicon Foundries SE

Type

Article

Journal

Microelectronics reliability

Volume

52

Pages

2447-2451

No. of pages

5

ISSN

0026-2714

Publication date

09.2012

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Surfaces, Coatings and Films, Electrical and Electronic Engineering

Electronic version(s)

https://doi.org/10.1016/j.microrel.2012.07.012 (Access: Unknown)