Investigation of FPGA and SRAM Cells under Radiation Exposure

verfasst von

Kirsten Weide-Zaage, Guillermo Paya-Vaya, Katharina Schmidt, Dorian Hagenah

Abstract

Basically, every human as well as electronical equipment on earth, is naturally exposed to ionizing radiation. This may lead to unwanted failures, especially in microelectronic devices. This becomes more severe due to the continuously downscaling of microelectronic structures. The use of SRAM-based FPGAs for aerospace applications is viewed critically [1]-[3]. Autonomous driving and the expectation of more than 8000 new launched satellites, for navigation and communication, in the next few years increases the need for radiation hardened (Rad-Hard) components, which are expensive. Therefore, the aim is to find commercials-of-The-shelf (COTS), which meets the need for this kind of harsh environment. Normally, Rad-Hard components are specially designed and tested especially for the application in automotive. It is well known that test time in all cases is expensive and time-consuming. Furthermore, simulations are more and more desired to decrease test times and allow a deeper look into the physical behavior of components and devices.

Organisationseinheit(en)

Institut für Mikroelektronische Systeme

Externe Organisation(en)

Technische Universität Braunschweig
Wehrwissenschaftliches Institut Für Schutztechnologien - ABC-Schutz (WIS)

Typ

Aufsatz in Konferenzband

Publikationsdatum

2022

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Fließ- und Transferprozesse von Flüssigkeiten, Numerische Mechanik, Elektrotechnik und Elektronik, Maschinenbau, Elektronische, optische und magnetische Materialien, Modellierung und Simulation

Elektronische Version(en)

https://doi.org/10.1109/EuroSimE54907.2022.9758864 (Zugang: Geschlossen)